Transient Current Study on Pt/TiO2-x/Pt Capacitor
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概要
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Transient transport characteristic has been studied in the Pt/TiO2-x/Pt devices. A peak in the current density–time ($J$–$t$) curve was observed under direct-current (dc) electric field stress. The peak position ($\tau$) was investigated as a function of various dc field stress and measurement temperature ($T$). With increase of field stress and $T$, $\tau$ exhibits a decrease. After analyzing the present result according to space-charge-limited current (SCLC) theory and electron/hole conduction influenced mode, we concluded that the transient current of Pt/TiO2-x/Pt device does not come from the oxygen vacancy (VO) migration directly, but the electron/hole transport. The peak in the $J$–$t$ curve is attributed to the change of electron/hole conduction caused by VO redistribution under dc field stress.
- 2010-04-25
著者
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Hiro Akinaga
Nanodevice Innovation Research Center and Nanotechnology Research Institute, National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8568, Japan
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Ni Zhong
Nanodevice Innovation Research Center (NIRC), National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Hisashi Shima
Nanodevice Innovation Research Center (NIRC), National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
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Hiro Akinaga
Nanodevice Innovation Research Center (NIRC), National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
関連論文
- Transient Current Study on Pt/TiO2-x/Pt Capacitor
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