New Radiophotoluminescence Glass Dosimeter with Specialized Radiation-Sensitive Surface Layer
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概要
- 論文の詳細を見る
A new radiophotoluminescence (RPL) dosimeter with a specialized radiation-sensitive surface layer was successfully fabricated from phosphate glass by the melting method. The radiation-sensitive surface layer, which was measured using an excitation laser and a fluorescence microscope, was formed through the thermal diffusion of silver atoms. It was found from RPL observations that the diffusion coefficient of silver atoms in phosphate glass was about 1.4 μm2/s at 400 °C and activation energy for silver atoms was about 0.7 eV. It was also confirmed that the newly synthesized dosimeter showed a satisfactory response to alpha rays and the effect of the annealing process on the dosimeter could be estimated on the basis of a thermal diffusion model of silver atoms in the glass.
- 2010-11-25
著者
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Murata Isao
Division Of Electrical Electronic And And Information Engineering Graduate School Of Engineering Osa
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Iida Toshiyuki
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Sato Fuminobu
Division Of Electrical Electronic And Information Engineering Graduate School Of Engineering Osaka U
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Kato Yushi
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Kato Yushi
Division of Electric, Electronic and Information Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Yamamoto Takayoshi
Oarai Research Center, Chiyoda Technol Corporation, 3681 Narita-cho, Oarai, Ibaraki 311-1313, Japan
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Maki Daisuke
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Kobayashi Hatsumi
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Murata Isao
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Sato Fuminobu
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Sato Fuminobu
Division of Electric, Electronic and Information Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Yamamoto Takayoshi
Oarai Research Center, Chiyoda Technol Corporation, 3681 Naritacho, Oarai, Ibaraki 311-1313, Japan
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Iida Toshiyuki
Division of Electric, Electronic and Information Engineering, Osaka University, Suita, Osaka 565-0871, Japan
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Kobayashi Hatsumi
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University
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Maki Daisuke
Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University
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