Characterization of columnar InAs/GaAs quantum-dot structures using grazing incidence x-ray diffraction

スポンサーリンク

概要

• 論文の詳細を見る

• Grazing incidence X-ray diffraction (GIXD) measurement using equipment available for laboratories was realized for the evaluation of columnar InAs/GaAs quantum dots (QDs). The QDs were grown by direct stacking of small self-assembled islands in the growth direction, and we prepared some samples by changing the number of units stacked. Using an imaging plate for a detector, we successfully observed that QD-related signals appeared around a GaAs(220) peak. The QD signals extended in the direction of the 2・・axis, and the extension increased with increasing number of stacks in the columnar QD growths. The results of the measurements were evaluated by a simulation based on the finite element method. Using a simple model that divides the QDs into an InAs columnar core and an InGaAs transition domain, we found that the core was expanded according to the increase in the stacking number. We also found that the lattice constant increased almost uniformly toward the upper part inside the QD.GIXD evaluation in laboratories will enhance the speed of the development of QD devices.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2009-04-25

著者

• Mukai Kohki

  Department Of Mechanical Engineering And Materials Science Yokohama National University

• Mukai Kohki

  Department of Mechanical Engineering and Materials Science, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan

• Kimura Yuuta

  Department of Solid State Materials and Engineering, Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan

• Kimura Yuuta

  Department of Mechanical Engineering and Materials Science, Yokohama National University, 79-5 Tokiwadai, Hodogaya-ku, Yokohama 240-8501, Japan

関連論文

• Electoroless and electrolytic plating of photopolymerized resin for use in the micro-moldintg of three dimensional nickel structures
• Ferrite and copper electroless plating to photopolymerized resin for micro molding of three-dimensional structures
• Micromolding of three-dimensional metal structures by electroless plating of photopolymerized resin (Special issue: Solid state devices and materials)
• Micro molding of three-dimensional metal structures by electroless plating of photopolymerized resin
• Electroless and electrolytic plating of Ni, Cu, and Co_xFe_2-xO_4 for the application of three-dimensional micro-moding
• Micromolding of Three-Dimensional Metal Structures by Electroless Plating of Photopolymerized Resin
• Micromolding for three-dimensional metal microstructures using stereolithography of photopolymerized resin
• Ferrite and copper electroless plating of photopolymerized resin for micromolding of three-dimensional structures
• Grazing incidence x-ray diffraction measurements of columnar InAs/GaAsq quantum dot structures
• Characterization of columnar InAs/GaAs quantum-dot structures using grazing incidence x-ray diffraction

スポンサーリンク