Spectral Analysis of Nanomaterials using a Transition-Edge Sensor Microcalorimeter Mounted on a Field-Emission Scanning Electron Microscope
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概要
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A prototype transition-edge sensor (TES) microcalorimeter is successfully integrated into a commercial field-emission scanning electron microscope (FE-SEM). The microcalorimeter is composed of a gold (Au) absorber, a Au/Ti bilayer thermometer and a thermal isolation structure with a SiNx membrane. Operating temperatures of 100–150 mK are obtained with a dilution refrigerator. The measured energy resolution was between 19–22 eV for Al K$\alpha$ at an acceleration voltage of 5 keV. The newly developed system was applied to the analysis of nanosheets for the first time at a low acceleration voltage (${\leq} 5$ kV). The energy dispersive spectrometer (EDS) spectra of Nb3O8 nanosheets of different thicknesses (less than 20 nm) were successfully detected. Moreover, Au particles on carbon nanotubes with a thickness less than 1 nm are detected clearly. With further improvement of both energy resolution and count rate, this system holds the promise for practical X-ray compositional characterization of nanomaterials with high image spatial resolution in the low-acceleration-voltage regime.
- 2008-06-25
著者
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NAKAYAMA Satoshi
SII Nano Technology Inc.
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Baba Yukari
Sii Nano Technol. Inc. Shizuoka‐ken Jpn
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HOMMA Yoshikazu
Faculty of Science, Tokyo University of Science
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Nakai Izumi
Faculty Of Science Tokyo University Of Science
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Tanaka Keiichi
Sii Nano Technology Inc.
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Ono Yuki
Faculty of Science, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan
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Li Qinghui
Faculty of Science, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan
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Fukuda Katsutoshi
Nanoscale Materials Center, NIMS, Tsukuba, Ibaraki 305-004, Japan
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Sasaki Takayoshi
Nanoscale Materials Center, NIMS, Tsukuba, Ibaraki 305-004, Japan
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Nakai Izumi
Faculty of Science, Tokyo University of Science, Shinjuku, Tokyo 162-8601, Japan
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Baba Yukari
SII NanoTechnology Inc., Matsudo, Chiba 270-2222, Japan
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Nakayama Satoshi
SII NanoTechnology Inc., Matsudo, Chiba 270-2222, Japan
関連論文
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