Optical-Beam-Induced-Current Analysis of Wear-Out Degradation in High-Reliability Fabry–Perot Laser Diodes for Access Networks

概要

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Reliability of a Fabry–Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over $2\times 10^{5}$ h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
2008-06-25