Effect of Electrical Stressing History on Slow Polarization Behavior in Composite of Low-Density Polyethylene and Nano-SiOx
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概要
- 論文の詳細を見る
Nano-SiOx was homogeneously dispersed in low-density polyethylene (LDPE) and its dispersion status was investigated by scanning electron microscopy (SEM). Samples of LDPE and a composite containing 3 wt % nano-SiOx were polarized at a dc stress of $2\times 10^{6}$ V/m and then depolarized three times. The depolarization currents of both samples were converted to the frequency domain to analyze dielectric loss ($\varepsilon''$). LDPE shows a typical slow polarization spectrum shifting upwards with electrical stressing time in the range of $1\times 10^{-3}$–$1\times 10^{-1}$ Hz. The $\varepsilon''$ of the composite showed no peak in the range and it was considerably smaller than that of LDPE. Moreover, the $\varepsilon''$ of the composite did not vary significantly with electrical stressing time.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-09-15
著者
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Yin Yi
Department Of Electrical Engineering School Of Electronics Information And Electrical Engineering Sh
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Dong Xiaobing
Department Of Electrical Engineering Shanghai Jiao Tong University
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Xiao Dengming
Department Of Electrical Engineering Shanghai Jiaotong University
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Li Zhe
Department of Electrical Engineering, School of Electronics and Electrical Engineering, Shanghai Jiao Tong University, Dongchuan Road 800, Minhang, Shanghai 200240, China
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Yin Yi
Department of Electrical Engineering, School of Electronics and Electrical Engineering, Shanghai Jiao Tong University, Dongchuan Road 800, Minhang, Shanghai 200240, China
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Li Xuguang
Department of Electrical Engineering, School of Electronics and Electrical Engineering, Shanghai Jiao Tong University, Dongchuan Road 800, Minhang, Shanghai 200240, China
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Dong Xiaobing
Department of Electrical Engineering, School of Electronics and Electrical Engineering, Shanghai Jiao Tong University, Dongchuan Road 800, Minhang, Shanghai 200240, China
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Xiao Dengming
Department of Electrical Engineering, School of Electronics and Electrical Engineering, Shanghai Jiao Tong University, Dongchuan Road 800, Minhang, Shanghai 200240, China
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