Double Exchange Biased Magnetic Force Microscopy Tip and Comparison of Its Imaging Performance with Commercial Tips

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概要

• 論文の詳細を見る

• A double exchange biased magnetic force microscopy tip, which is coated with an antiferromagnet (IrMn)/ferromagnet (CoFe)/antiferromagnet (IrMn) multilayer on one side of a bare tip, has been fabricated and studied. In this design, the CoFe layer can be very thin due to its high moment, which leads to high spatial resolution without sacrificing the signal intensity. The exchange coupling between IrMn and CoFe stabilizes the magnetization of the latter which enables this kind of tip to have a better sensitivity and thermal stability as compared to conventional single ferromagnet layer tips. The performance of the double exchange biased tips has been evaluated through imaging the magnetic patterns recorded on longitudinal magnetic recording media. Micromagnetic modeling has been conducted to understand the underlying mechanism of the tip performance improvement.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2007-07-15

著者

• Zheng Yuankai

  Data Storage Institute

• Wu Yihong

  Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576

• Yihong Gang

  Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576

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• Double Exchange Biased Magnetic Force Microscopy Tip and Comparison of Its Imaging Performance with Commercial Tips

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