Effective-Mass Anomalies of Strained Silicon Thin Films: Surface and Confinement Effects
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概要
- 論文の詳細を見る
Using a first-principles calculation, we systematically investigated the effective-mass anomalies in $\langle 111\rangle$- and $\langle 110\rangle$-confined Si thin films. The surface terminators, which correspond to the interface between the Si channel and the insulator in real devices, do not have a significant effect on the effective mass anomalies. The effective-mass behaviors as a function of the substrate thickness and the strain is qualitatively well explained by the extended effective-mass approximation using the bulk effective-mass along the confinement direction.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-05-30
著者
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Matsuno Shunichi
General Education Center, Shimizu Campus, Tokai University, 3-20-1 Orido, Shimizu-ku, Shizuoka 424-8610, Japan
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Yamauchi Jun
Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8580, Japan
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Yamauchi Jun
Institute for Chemical Research, Kyoto University
関連論文
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