Measurement of Cantilever Displacement Using a Compact Disk/Digital Versatile Disk Pickup Head

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概要

• 論文の詳細を見る

• We use the optical pickup head of a commercial compact disk (CD)/digital versatile disk (DVD) read only memory (ROM) drive to detect the vertical displacement of micro fabricated cantilever in atomic force microscopy (AFM). Both the contact and AC modes of AFM are demonstrated. The single atomic steps of graphite can be resolved, indicating that atomic resolution in the vertical displacement detection can be achieved with this new setup. The low cost, compact size, and the light weight of CD/DVD optical pickups may offer new advantages in future AFM designs.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2006-03-30

著者

• Hwang Ing-shouh

  Institute Of Physics Academia Sinica Nankang

• Hwu En-Te

  Department of Mechanical Engineering, National Taiwan University, Taipei, Taiwan

• Hwu En-Te

  Department of Mechanical Engineering, National Taiwan University, Taipei 106, Taiwan, R.O.C.

• Huang Kuang-Yuh

  Department of Mechanical Engineering, National Taiwan University, Taipei 10617, Taiwan

• Hung Shao-Kang

  Institute of Physics, Academia Sinica, Taipei, Taiwan

• Huang Kuang-Yuh

  Department of Mechanical Engineering, National Taiwan University, Taipei, Taiwan

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