Atomic-Resolution Dynamic Force Microscopy/Spectroscopy of Individual Single-Walled Carbon Nanotube
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概要
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We report the atomic-resolution imaging of an individual single-walled carbon nanotube and quantitative measurements of forces above specific atomic sites by dynamic force microscopy and three-dimensional force field spectroscopy at low temperatures. The detailed structure, i.e., the pair of indices $(n,m)$ corresponding to a chiral angle $\phi$ and diameter $d$, is derived from atomic resolution images. Through the evaluation of short-range forces, the chemical reactivity of nanotube surface is found to be very weak when the interatomic short-range van der Waals forces are dominant.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-03-30
著者
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Wiesendanger Roland
Institute Of Applied Physics And Microstructure Research Center University Of Hamburg
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Ashino Makoto
Institute of Applied Physics and Microstructure Advanced Research Center, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany
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Wiesendanger Roland
Institute of Applied Physics and Microstructure Advanced Research Center, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany
関連論文
- Recent Advances in Nanostructural Investigations and Modifications of Solid Surfaces by Scanning Probe Methods
- Atomic-Resolution Dynamic Force Microscopy/Spectroscopy of Individual Single-Walled Carbon Nanotube
- Dynamic Scanning Force Microscopy at Low Temperatures
- Low Density Two-Dimensional Electron Systems Studied by Scanning Tunneling Spectroscopy
- Recent Advances in Nanostructural Investigations and Modifications of Solid Surfaces by Scanning Probe Methods