Dynamic Scanning Force Microscopy at Low Temperatures
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概要
- 論文の詳細を見る
In this paper, we review the design and various applications of a low temperature scanning force microscope for ultrahigh vacuum. It has been adopted for dynamic mode measurements, a powerfurl method to image surfaces with a resolution similar to scanning tunneling microscopy, but without the limitation to conducting materials. With this instrument, we have studied semiconducting(InAs), conducting(HOPG) and insulating samples(xenon thin film). Finally, we discuss a new experimental method to determine the tip-sample interaction with high accuracy.
- 社団法人応用物理学会の論文
- 2000-06-30
著者
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Wiesendanger Roland
Institute Of Applied Physics And Microstructure Research Center University Of Hamburg
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SCHWARZ Udo
Institute of Applied Physics and Microstructure Research Center, University of Hamburg
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SCHWARZ Alexander
Institute of Applied Physics and Microstructure Research Center, University of Hamburg
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Allers Wolf
Institute of Applied Physics and Microstructure Research Center, University of Hamburg
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Holscher Hendrik
Institute of Applied Physics and Microstructure Research Center, University of Hamburg
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WIESENDANGER Roland
Institute of Applied Physics and Microstructure Research Center, University of Hamburg
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Wiesendanger Roland
Institute of Applied Physics and Microstructure Advanced Research Center, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany
関連論文
- Recent Advances in Nanostructural Investigations and Modifications of Solid Surfaces by Scanning Probe Methods
- Atomic-Resolution Dynamic Force Microscopy/Spectroscopy of Individual Single-Walled Carbon Nanotube
- Dynamic Scanning Force Microscopy at Low Temperatures
- Low Density Two-Dimensional Electron Systems Studied by Scanning Tunneling Spectroscopy
- Recent Advances in Nanostructural Investigations and Modifications of Solid Surfaces by Scanning Probe Methods