Hard X-ray Photoelectron Emission Microscopy as Tool for Studying Buried Layers
スポンサーリンク
概要
- 論文の詳細を見る
We have performed photoelectron emission microscopy measurements with hard X-rays (HX-PEEM) and have shown that HX-PEEM has a spatial resolution higher than 106 nm for observing the sample surface and can detect signals from a Au layer buried under a 50-nm-thick Co layer. These results mean that HX-PEEM has a probing depth one order of magnitude deeper than that of PEEM with soft X-rays. This deeper probing depth with HX-PEEM provides a new opportunity to investigate electronic and/or magnetic structures of buried layers under a thick overlayer. The notable advantages and potential applications of HX-PEEM are discussed.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-03-15
著者
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KOBAYASHI Keisuke
Japan Synchrotron Radiation Research Institute/SPring-8
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Muro Takayuki
Japan Synchrotron Radiation Res. Inst. Hyogo Jpn
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Ono Kanta
Institute For Material Structure Science High Energy Accelerator Research Organization
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NAKAMURA Tetsuya
Japan Synchrotron Radiation Research Institute
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Wakita Takanori
Japan Synchrotron Radiation Research Institute
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Kawamura Naomi
Japan Synchrotron Radiation Research Institute
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Suzuki Motohiro
Japan Synchrotron Radiation Research Institute
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Akinaga Hiroyuki
Nanotechnology Research Institute National Institute Of Advanced Industrial Science And Technology
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Oshima Masaharu
Department Of Applied Chemistry Graduate School Of Engineering The University Of Tokyo
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Muro Takayuki
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Wakita Takanori
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Ono Kanta
Institute of Material Structure Science (IMSS)/Photon Factory (PF)/High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan
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Taniuchi Toshiyuki
Department of Applied Chemistry, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8586, Japan
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Takagaki Masafumi
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Miyagawa Hayato
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Guo FangZhun
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Yokoya Takayoshi
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Suzuki Motohiro
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Kawamura Naomi
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Akinaga Hiroyuki
Nanotechnology Research Institute (NRI)/National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-0801, Japan
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Kobayashi Keisuke
Japan Synchrotron Radiation Research Institute (JASRI)/SPring-8, 1-1-1 Kouto, Sayo, Hyogo 679-5198, Japan
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Oshima Masaharu
Department of Applied Chemistry, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8586, Japan
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OSHIMA Masaharu
Department of Applied Chemistry and JST-CREST, The University of Tokyo
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