CoFe-Coated Carbon Nanotube Probes for Magnetic Force Microscope
スポンサーリンク
概要
- 論文の詳細を見る
CoFe-coated carbon nanotube (CNT) probes have been successfully fabricated by a radio-frequency sputtering method. The sputtering conditions for obtaining a uniform ferromagnetic film on the CNT probe were investigated. The optimal sputtering conditions were determined from the observations using a scanning electron microscope and an atomic force microscope. CNT magnetic force microscope (MFM) probes prepared under optimized conditions provided us clear images with an ultimate lateral resolution of approximately 10 nm.
- 2005-04-15
著者
-
Tanaka Atsushi
Research Group For Plant Genes Advanced Science Research Center Japan Atomic Energy Research Institu
-
Uzumaki Takuya
Research Consortium For Synthetic Nano-function Materials Project (synaf) National Institute Of Adva
-
Akinaga Hiroyuki
Research Consortium For Synthetic Nano-function Materials Project (synaf) National Institute Of Adva
-
Kuramochi Hiromi
Research Consortium For Synthetic Nano-function Materials Project (synaf) National Institute Of Adva
-
Yokoyama Hiroshi
Research Consortium for Synthetic Nano-Function Materials Project (SYNAF), National Institute of Adv
-
Yasutake Masatoshi
Research Consortium for Synthetic Nano-Function Materials Project (SYNAF), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
-
Semba Yasuyuki
Nanotechnology Research Institute (NRI), AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
-
Kijima Mihoko
Nanotechnology Research Institute (NRI), AIST, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
-
Akinaga Hiroyuki
Research Consortium for Synthetic Nano-Function Materials Project (SYNAF), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
-
Tanaka Atsushi
Research Consortium for Synthetic Nano-Function Materials Project (SYNAF), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
-
Uzumaki Takuya
Research Consortium for Synthetic Nano-Function Materials Project (SYNAF), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
関連論文
- Magnetic Domain Structure of MaAs Thin Films as a Function of Temperature
- Repair of UV-induced DNA damage in the UV-B resistant mutants of Arabidopsis thaliana induced by ion beams.
- Magnetization-induced Second-Harmonic Generation in Magnetic Semiconductor (Ga,Mn)As(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Magnetization-induced Second-Harmonic Generation in Magnetic Semiconductor (Ga, Mn)As
- Molecular Analysis of Carbon Ion Beam-Induced gl1 mutations in Arabidopsis thaliana
- Molecular analysis of carbon ion-induced mutations in Arabidopsis thaliana
- A new Arabidopsis mutant induced by ion beams affects flavonoid synthesis with spotted pigmentation in testa
- Carbon Ion Beam-Induced Mutations in Arabidopsis thaliana
- Reduced rejoining ability of DNA strand breaks with differentiation in barley root cells
- Effects of heavy ion beams on the rate of germination and plant survival in Arabidopsis thaliana
- Development of an ion microbeam system for irradiating single plant cell[s]
- Minute Current Detection during Anodic Oxidation by Atomic Force Microscope At High Humidity
- Genomic relationships among Nicotiana species with different ploidy levels revealed by 5S rDNA spacer sequences and FISH/GISH
- CoFe-Coated Carbon Nanotube Probes for Magnetic Force Microscope
- Reactive Ion Etching of NiFe Thin Films from First-Principles Study: A Case Study
- Reduced Humidity Effects on Probe Nano-Oxidation Investigated Using Dynamic Force Microscope