Blocking Impurities in Organic Light Emitting Device by Inserting Parylene Interlayer

概要

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Secondary-ion mass spectrometry is used to study ion diffusion from a substrate into an organic film, which is considered as one of the reasons for organic-light-emitting-device degradation and instability. Results show that a 1 μm-thick parylene layer inserted between an indium–tin–oxide (ITO) anode and a soda-lime glass substrate effectively controls the diffusion of sodium, potassium, silicon and sulphur ions from the substrate to the device. The effect is the same as that in the case of using a plastic substrate which is sodium- and potassium-free. Also a 3 nm-thick parylene layer grown in between an ITO anode and a hole transport layer (HTL) not only shows improvement in device performance, but also is capable of blocking impurities such as sodium, potassium, silicon and sulphur ions. This study shows that the use of a parylene layer is effective for controlling contamination coming from the substrate.
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
2005-01-15