Indium Incorporation Coefficients in the Growth of AlInGaAs/Al0.3Ga0.7As Quantum Wells by Molecular Beam Epitaxy
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概要
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Using the emission wavelength and well thickness data of AlInGaAs/Al0.3Ga0.7As quantum wells obtained from room temperature photoluminescence and transmission electron microscopy, indium incorporation coefficients are determined for the growth of the quantum wells by molecular beam epitaxy (MBE). At a growth temperature of 600°C, the indium incorporation coefficient is found to be 0.54.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1998-06-15
著者
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Chua Soo-jin
Center Of Optoelectronics National University Of Singapore
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Chua Soo-jin
Center For Optoelectronics Department Of Electrical Engineering National University Of Singapore Ins
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Zhang Zhi-he
Center For Optoelectronics Department Of Electrical Engineering National University Of Singapore
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- Indium Incorporation Coefficients in the Growth of AlInGaAs/Al0.3Ga0.7As Quantum Wells by Molecular Beam Epitaxy
- Blocking Impurities in Organic Light Emitting Device by Inserting Parylene Interlayer