Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes

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概要

• 論文の詳細を見る

• The relationship between the residual stress and dielectric properties of multilayer ceramic capacitors with Ni electrodes (Ni-MLCCs) has been studied. Residual stress measurement by X-ray diffraction revealed that tensile stress inside MLCCs in the thickness direction increased with increasing number of dielectric layers. The increase in the ratio of the $c$-axis to the $a$-axis of BaTiO3 in the thickness direction of MLCCs was expected from the results of X-ray diffraction with increasing number of dielectric layers. The increase in dielectric constant and its temperature dependence with increasing number of dielectric layers were expectedly related to crystal structures.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2004-08-15

著者

• NAKANO Yukie

  TDK Corporation

• NOMURA Takeshi

  TDK Corporation

• TAKENAKA Tadashi

  Tokyo University of Science

• Takenaka Tadashi

  Tokyo University of Science, 2641, Yamazaki, Noda-shi, Chiba 278-0022, Japan

• Nomura Takeshi

  TDK Corporation, 570-2, Matsugashita, Minamihatori, Narita-shi, Chiba 286-8588, Japan

• Nakano Yukie

  TDK Corporation, 570-2, Matsugashita, Minamihatori, Narita-shi, Chiba 286-8588, Japan

関連論文

• Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes
• Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes
• Residual Stress of Multilayer Ceramic Capacitors with Ni-Electrodes (Ni-MLCCs)

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