Residual Stress of Multilayer Ceramic Capacitors with Ni-Electrodes (Ni-MLCCs)

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概要

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• The residual stress of multilayer ceramic capacitors (MLCCs) has been studied. The capacitance decreased significantly under external compressive stress applied to MLCCs in the thickness direction, on the other hand, the capacitance increased under external stress in the width direction. These capacitance changes depended on the number of dielectric layers in MLCCs. The compressive residual stress at the surface of MLCCs has been shown by X-ray diffraction (XRD) analysis. The stress increased with the number of dielectric layers in MLCCs. Moreover the tensile stress was confirmed in the thickness direction of MLCCs by XRD analysis also. Therefore the dependence of electrical characteristics dependence on the number of dielectric layers, i.e., apparent dielectric constant, temperature dependence of capacitance, and aging deterioration can be explained by the residual stress.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2003-09-15

著者

• NAKANO Yukie

  TDK Corporation

• NOMURA Takeshi

  TDK Corporation

• TAKENAKA Tadashi

  Tokyo University of Science

• Takenaka Tadashi

  Tokyo University of Science, 2641 Yamazaki, Noda-shi, Chiba 278-8510, Japan

• Nomura Takeshi

  TDK corporation, 570-2 Matsugashita, Minamihatori, Narita-shi, Chiba 286-8588, Japan

• Nakano Yukie

  TDK corporation, 570-2 Matsugashita, Minamihatori, Narita-shi, Chiba 286-8588, Japan

関連論文

• Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes
• Number of Dielectric Layers Dependence of Dielectric Properties and Residual Stress of Multilayer Ceramic Capacitors with Ni Electrodes
• Residual Stress of Multilayer Ceramic Capacitors with Ni-Electrodes (Ni-MLCCs)

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