Silicon Tip Cantilevers for Force Microscopy in Water with Resonance of 20 kHz or Above
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概要
- 論文の詳細を見る
Silicon nitride cantilevers with a silicon probe have been developed for force microscopy of soft samples in water. The cantilevers were soft with a small spring constant of from 0.05 to 0.11 N/m and some showed resonance of 20 kHz or higher in water. The typical dimensions of a cantilever were $40\,\micron \times 15\,\micron \times 0.19\,\micron$. Autofluorescent light emissions from the resulting cantilever and probe were studied. Autofluorescence of the silicon nitride cantilever was smaller than that of a conventional silicon nitride cantilever. Autofluorescence of the silicon probe was small and of negligible intensity for fluorescence optical microscopy. The cantilever probe less disturbs fluorescence optical microscopy than conventional soft cantilever probes.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-07-15
著者
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KITAZAWA Masashi
MEMS Technology Division, Olympus Corp.
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YAGI Akira
Scientific Equipment Division, Olympus Corp.
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Toda Akitoshi
Scientific Equipment Division Olympus Optical Co. Ltd.
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Yagi Akira
Scientific Equipment Division, Olympus Corp., 2951 Ishikawa-cho, Hachioji, Tokyo 192-8057, Japan
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Toda Akitoshi
Scientific Equipment Division, Olympus Corp., 2951 Ishikawa-cho, Hachioji, Tokyo 192-8057, Japan
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Kitazawa Masashi
MEMS Technology Division, Olympus Corp., 6666 Inatomi, Tatsuno, Nagano 399-0495, Japan
関連論文
- Silicon Tip Cantilevers for Force Microscopy in Water with Resonance of 20kHz or Above
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- Silicon Tip Cantilevers for Force Microscopy in Water with Resonance of 20 kHz or Above
- Batch Fabrication of Sharpened Silicon Nitride Tips