Control of the Figure of Merit by the Anti-site Defect in Thermoelectric Materials (Bi,Sb)2Te3
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概要
- 論文の詳細を見る
Basic physical properties of the thermoelectric materials of p-type (Bi,Sb)2Te3 have been measured. The temperature $T_{\text{Z-peak}}$, at which the figure of merit $Z$ takes a maximum, the resistivity and the Seebeck coefficient show the linear Hall coefficient dependences. These behaviors are strongly related to the anti-site defect between the Bi (or Sb) and the Te site and the $T_{\text{Z-peak}}$ systematically decreases with the decrease of the anti-site defect which corresponds to the decrease of the number of hole carriers. It is proposed that the figure of merit could be controlled by the anti-site defect. A possibility of the application of the thermoelectric materials at low temperature is also proposed.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-09-15
著者
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Kajihara Takeshi
Research Division Komatsu Ltd.
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Iwasaki Hideo
Japan Advanced Institute Of Science And Technology Jaist
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Sano Seijirou
Japan Advanced Institute Of Science And Technology Jaist
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Ohishi Akihiro
Japan Advanced Institute Of Science And Technology Jaist
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Sano Seijirou
Japan Advanced Institute of Science and Technology, JAIST, Asahidai 1-1, Tatsunokuchi 923-1292, Japan
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Iwasaki Hideo
Japan Advanced Institute of Science and Technology, JAIST, Asahidai 1-1, Tatsunokuchi 923-1292, Japan
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Kajihara Takeshi
Research Division, Komatsu Ltd., 1200 Manda, Hiratsuka 254-8567, Japan
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Ohishi Akihiro
Japan Advanced Institute of Science and Technology, JAIST, Asahidai 1-1, Tatsunokuchi 923-1292, Japan
関連論文
- Evaluation of the Figure of Merit of Thermoelectric Modules by Harman Method
- Evaluation of the Figure of Merit on Thermoelectric Materials by Harman Method
- Control of the Figure of Merit by the Anti-site Defect in Thermoelectric Materials (Bi, Sb)_2Te_3
- Evaluation of the Figure of Merit of Thermoelectric Modules by Harman Method
- Control of the Figure of Merit by the Anti-site Defect in Thermoelectric Materials (Bi,Sb)2Te3