Control of the Figure of Merit by the Anti-site Defect in Thermoelectric Materials (Bi, Sb)_2Te_3

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2003-09-15

著者

• Kajihara Takeshi

  Research Division Komatsu Ltd.

• Iwasaki Hideo

  Japan Advanced Institute Of Science And Technology Jaist

• Sano Seijirou

  Japan Advanced Institute Of Science And Technology Jaist

• Ohishi Akihiro

  Japan Advanced Institute Of Science And Technology Jaist

関連論文

• Evaluation of the Figure of Merit of Thermoelectric Modules by Harman Method
• Evaluation of the Figure of Merit on Thermoelectric Materials by Harman Method
• Control of the Figure of Merit by the Anti-site Defect in Thermoelectric Materials (Bi, Sb)_2Te_3
• Evaluation of the Figure of Merit of Thermoelectric Modules by Harman Method
• Control of the Figure of Merit by the Anti-site Defect in Thermoelectric Materials (Bi,Sb)2Te3

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