Formation of LaSi2-x Layers on Si by High-Current La Ion Implantation
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概要
- 論文の詳細を見る
Lanthanum ion implantation into Si was conducted using a metal vapor vacuum arc ion source, and the continuous and relatively stable LaSi2-x layers on the Si surface with a strong texture and low electrical resistivity were directly obtained with neither external heating nor post annealing. The optimal experimental parameters for synthesizing LaSi2-x are an ion current density of 52.8 μA/cm2, corresponding to a formation temperature of around 390°C, and an implantation dose of $2\times 10^{17}$ ions/cm2. In addition, the formation mechanism of the LaSi2-x phase is discussed, in terms of the temperature rise caused by ion beam heating and the ion dose in the process of implantation.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-05-15
著者
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Liu Bai
Advanced Materials Laboratory Department Of Materials Science And Engineering Tsinghua University
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Tang Xiao
Advanced Materials Laboratory Department Of Materials Science And Engineering Tsinghua University
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Wang Run
Advanced Materials Laboratory Department Of Materials Science And Engineering Tsinghua University
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Cheng Xiang
Advanced Materials Laboratory Department Of Materials Science And Engineering Tsinghua University
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Cheng Xiang
Advanced Materials Laboratory, Department of Materials Science and Engineering, Tsinghua University, Beijing100084, China
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Liu Bai
Advanced Materials Laboratory, Department of Materials Science and Engineering, Tsinghua University, Beijing100084, China
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Wang Run
Advanced Materials Laboratory, Department of Materials Science and Engineering, Tsinghua University, Beijing100084, China
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Tang Xiao
Advanced Materials Laboratory, Department of Materials Science and Engineering, Tsinghua University, Beijing100084, China
関連論文
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- Formation of LaSi2-x Layers on Si by High-Current La Ion Implantation