Data Reliability Deterioration of Phase-Change Discs Caused by Lowering of Crystallization Speed of Amorphous Marks through a High Environmental Temperature Storage

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概要

• 論文の詳細を見る

• We describe details of a data reliability testing procedure of phase-change discs called "overwrite shelf" concerning structural relaxation of recorded amorphous marks in recording film, which should be considered when designing phase-change discs. The overwrite shelf denotes the erase performance of a previously recorded disc. We have found that data subjected to the overwrite shelf operation greatly deteriorates after the disc has been held at a high environmental temperature which is much below the crystallization temperature of the amorphous marks. This is considered to be due to the lowering of the crystallization speed of amorphous marks in phase-change discs through structural relaxation. Therefore, in order to avoid data destruction in the overwrite shelf operation, the crystallization speeds of phase-change discs should be designed to be faster than those expected from the initial properties, to compensate the lowering of crystallization speeds.

• INSTITUTE OF PURE AND APPLIED PHYSICSの論文
• 2002-05-15

著者

• Yoshinari Jiro

  Data Storage Technology Center Tdk Corporation

• Utsunomiya Hajime

  Data Storage Technology Center Tdk Corporation

• Kosuda Masanori

  Development Department. Recording Media Division Tdk Corporation

• Kikukawa Takashi

  Data Storage Technology Center Tdk Corp.

• Utsunomiya Hajime

  Data Storage Technology Center, TDK Corporation, 462-1, Otai, Saku, Nagano 385-0009, Japan

• Kosuda Masanori

  Development Department, Recording Media Division, TDK Corporation, 113, Nenei, Saku, Nagano 385-8601, Japan

関連論文

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• The Phase Change Optical Disc with the Data Recording Rate of 140 Mbps
• Phase-Change Optical Disc with the Data Recording Rate of 100Mbps
• High-Density Read-Only Memory Disc with Supper Resolution Reflective Layer
• Data Reliability Deterioration of Phase-Change Discs Caused by Lowering of Crystallization Speed of Amorphous Marks through a High Environmental Temperature Storage
• Super-Resolution Near-Field Structure and Signal Enhancement by Surface Plasmons
• Phase-Change Optical Disc with the Data Recording Rate of 100 Mbps
• Data Reliability Deterioration of Phase-Change Discs Caused by Lowering of Crystallization Speed of Amorphous Marks through a High Environmental Temperature Storage

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