Data Reliability Deterioration of Phase-Change Discs Caused by Lowering of Crystallization Speed of Amorphous Marks through a High Environmental Temperature Storage
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-05-15
著者
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KIKUKAWA Takashi
Data Storage Technology Center, TDK Corp.
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UTSUNOMIYA Hajime
Data Storage Technology Center. TDK Corporation Chikumagawa the Ist. Technical Center
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Kikukawa Takashi
Data Storage Technology Center Tdk Corporation
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KOSUDA Masanori
Development Department. Recording Media Division, TDK Corporation
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YOSHINARI Jiro
Data Storage Technology Center, TDK Corporation
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Yoshinari Jiro
Data Storage Technology Center Tdk Corporation
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Utsunomiya Hajime
Data Storage Technology Center Tdk Corporation
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Kosuda Masanori
Development Department. Recording Media Division Tdk Corporation
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Kikukawa Takashi
Data Storage Technology Center Tdk Corp.
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Kosuda Masanori
Development Department, Recording Media Division, TDK Corporation, 113, Nenei, Saku, Nagano 385-8601, Japan
関連論文
- Super-Resolution Read-Only Memory Disk with Metal Nanoparticles or Small Aperture
- Super-Resolution Near-Field Structure and Signal Enhancement by Surface Plasmons
- The Phase Change Optical Disc with the Data Recording Rate of 140 Mbps
- Phase-Change Optical Disc with the Data Recording Rate of 100Mbps
- High-Density Read-Only Memory Disc with Supper Resolution Reflective Layer
- Data Reliability Deterioration of Phase-Change Discs Caused by Lowering of Crystallization Speed of Amorphous Marks through a High Environmental Temperature Storage
- Super-Resolution Near-Field Structure and Signal Enhancement by Surface Plasmons
- Phase-Change Optical Disc with the Data Recording Rate of 100 Mbps
- Data Reliability Deterioration of Phase-Change Discs Caused by Lowering of Crystallization Speed of Amorphous Marks through a High Environmental Temperature Storage