Time-Domain Terahertz Spectroscopy of SrBi2Ta2O9 Thin Films on MgO Substrates
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概要
- 論文の詳細を見る
We measured the transmission spectra of terahertz wave through SrBi2Ta2O9 thin films on MgO substrate using time-domain terahertz spectroscopy and evaluated optical and dielectric constants as a function of frequency in the range of 0.3–2.0 THz. The imaginary part of the dielectric function has peaks around 0.8 and 1.8 THz. The results are consistent with the results of Raman scattering measurements. The real part of the dielectric function is below 100 in the measured frequency range and is much smaller than the static dielectric constant. This result implies the existence of polarization components in a lower frequency range.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2002-11-30
著者
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Kawayama Iwao
Research Center For Superconductor Photonics Osaka University
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TONOUCHI Masayoshi
Research Center for Superconducting Materials and Electronics, Osaka University
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KOTANI Kenta
Research Center for Superconductor Photonics, Osaka University
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Kotani Kenta
Research Center for Superconductor Photonics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Kawayama Iwao
Research Center for Superconductor Photonics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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Tonouchi Masayoshi
Research Center for Superconductor Photonics, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
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