Monitoring DNA Hybridization by Quantification of Nitrogen Content Using X-Ray Photoelectron Spectroscopy
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概要
- 論文の詳細を見る
X-ray photoelectron spectroscopy (XPS) was used to detect hybridization of surface-immobilized oligonucleotides for potential quantification of surface coverage and hybridization efficiency. XPS offers an alternative to DNA analysis with fluorescence radioisotope detection. The nitrogen content and the ratio of nitrogen from DNA to sulfur from alkanethiols introduced in surface immobilization was used as a proof of hybridization with statistical errors of less than 20%.
- Japan Society of Applied Physicsの論文
- 2007-01-25
著者
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Sandhu Adarsh
Quantum Nanoelectronics Research Center Tokyo Institute Of Technology
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SAKAMOTO Fumitaka
Thermo Electron Corporation
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Lapicki Adam
Quantum Nanoelectronics Research Center Tokyo Institute Of Technology
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Sandhu Adarsh
Quantum Nanoelectronics Research Center, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152-8552, Japan
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Lapicki Adam
Quantum Nanoelectronics Research Center, Tokyo Institute of Technology, O-okayama, Meguro-ku, Tokyo 152-8552, Japan
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- Monitoring DNA Hybridization by Quantification of Nitrogen Content Using X-Ray Photoelectron Spectroscopy