Monitoring DNA Hybridization by Quantification of Nitrogen Content Using X-Ray Photoelectron Spectroscopy

スポンサーリンク

概要

• 論文の詳細を見る
• Japan Society of Applied Physicsの論文
• 2007-01-25

著者

• Sandhu Adarsh

  Quantum Nanoelectronics Research Center Tokyo Institute Of Technology

• LAPICKI Adam

  Quantum Nanoelectronics Research Center, Tokyo Institute of Technology

• SAKAMOTO Fumitaka

  Thermo Electron Corporation

• Lapicki Adam

  Quantum Nanoelectronics Research Center Tokyo Institute Of Technology

関連論文

• Monitoring DNA Hybridization by Quantification of Nitrogen Content Using X-Ray Photoelectron Spectroscopy
• High Sensitivity InSb Ultra-Thin Film Micro-Hall Sensors for Bioscreening Applications
• Thin-Film Semiconductor Hall Effect Biosensors for Medical Applications
• Micro-Hall Devices for Scanning Hall Probe Microscopy
• High Sensitivity InSb Ultra-Thin Film Micro-Hall Sensors for Bioscreening Applications
• Monitoring DNA Hybridization by Quantification of Nitrogen Content Using X-Ray Photoelectron Spectroscopy

スポンサーリンク