Forming Tapered Pattern by Cu Electrodeposition Through Mask on Ni Seed Layer for Thin-Film Transistors
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概要
- 論文の詳細を見る
The fabrication of Cu gates for thin-film transistors (TFTs) by electrodeposition through mask on a Ni layer has been developed. After pretreatment in acid sulfate solution, a Cu deposit acquires the property of good adhesion on a Ni layer. Organic additives [e.g., poly(ethylene glycol) (PEG), bis(3-sodiumsulfopropyl) disulfide (SPS)] were used to create the desired tapered shape of the deposited Cu pattern on a Ni layer. Furthermore, a multilayer Cu gate for TFTs was fabricated after the selective etching of the nickel layer. The new method provides an alternative wet process for fabricating Cu gates for TFTs.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2006-11-25
著者
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Wang Yung
Department Of Chemical Engineering National Tsing Hua University
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CHEN Jing
Quanta Display Inc.
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Liu Po
Display Institute National Chiao Tung University
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Li Hung
Display Institute National Chiao Tung University
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Wan Chi
Department Of Chemical Engineering National Tsing Hua University
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Jenq Shrane
Department Of Chemical Engineering National Tsing Hua University
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Wang Yung
Department of Chemical Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, R.O.C.
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Jenq Shrane
Department of Chemical Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, R.O.C.
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Wan Chi
Department of Chemical Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, R.O.C.
関連論文
- Forming Tapered Pattern by Cu Electrodeposition Through Mask on Ni Seed Layer for Thin-Film Transistors
- Forming Tapered Pattern by Cu Electrodeposition Through Mask on Ni Seed Layer for Thin-Film Transistors
- Forming Tapered Pattern by Cu Electrodeposition Through Mask on Ni Seed Layer for Thin-Film Transistors