Measurement and Analysis of Cavity Loss of a 266 nm Continuous-Wave Solid-State Laser

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概要

• 論文の詳細を見る

• The effect of purge air on the reliability of a 266 nm continuous-wave (cw) solid-state laser was analyzed by measuring the cavity loss of an ultraviolet (UV) laser. The water content of the purge air strongly connected with the reliability of the laser. Irradiation by UV laser beam and existence of water around a mirror in an external cavity created scatterers on the surface of the mirror. The scatterers increased the cavity loss of the UV laser and markedly decreased the UV laser power.

• Japan Society of Applied Physicsの論文
• 2004-03-15

著者

• Kubota Shigeo

  Sony Co.

• Wada Hiroyuki

  Sony Co.

• Oka Michio

  Sony Co.

• TATSUKI Koichi

  SONY Co.

• SAITO Masaki

  SONY Co.

• Wada Hiroyuki

  SONY Co., 4-14-1 Asahi, Atsugi, Kanagawa 243-0014, Japan

• Tatsuki Koichi

  SONY Co., 4-14-1 Asahi, Atsugi, Kanagawa 243-0014, Japan

• Oka Michio

  SONY Co., 4-14-1 Asahi, Atsugi, Kanagawa 243-0014, Japan

• Kubota Shigeo

  SONY Co., 4-14-1 Asahi, Atsugi, Kanagawa 243-0014, Japan

関連論文

• Effect of Purge Gas on the Reliability of a 266nm Continuous-Wave Solid-State Laser(Lasers, Quantum Electronics)
• Performance and Reliability Improvement of HfSiON Field-Effect Transistor with Low Hafnium Concentration Cap Layer Formed by Metal Organic Chemical Vapor Deposition with Diethylsilane
• Measurement and Analysis of Cavity Loss of a 266 nm Continuous-Wave Solid-State Laser

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