Self-Aligned Planar Metal Double-Gate Polycrystalline-Silicon Thin-Film Transistors Fabricated at Low Temperature on Glass Substrate
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概要
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A multigate polycrystalline-silicon (poly-Si) thin-film transistor (TFT) is a recently popular topic in the field of Si devices. In this study, self-aligned planar metal double-gate poly-Si TFTs consisting of an embedded bottom metal gate, a top metal gate fabricated by a self-alignment process, and a lateral poly-Si film with a grain size greater than 2µm were fabricated on a glass substrate at 550°C. The nominal field-effect mobility of an n-channel TFT is 530cm2/Vs, and its subthreshold slope is 140mV/dec. The performance of the proposed TFTs is superior to that of top-gate TFTs fabricated using equivalent processes.
著者
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KONDO Kenji
Tohoku Gakuin University
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OGATA Hiroyuki
Tohoku Gakuin University
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ICHIJO Kenji
Tohoku Gakuin University
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HARA Akito
Tohoku Gakuin University
関連論文
- Gettering in Large-Grained Thin Polycrystalline Silicon Films on Glass Substrate
- Self-Aligned Planar Metal Double-Gate Polycrystalline-Silicon Thin-Film Transistors Fabricated at Low Temperature on Glass Substrate
- Self-Aligned Planar Metal Double-Gate Polycrystalline-Silicon Thin-Film Transistors Fabricated at Low Temperature on Glass Substrate