Local structures of isovalent and heterovalent dilute impurities in Si crystal probed by fluorescence x-ray absorption fine structure
スポンサーリンク
概要
著者
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Saini Naurang
<I>Universita di Roma ''''La Sapienza'', Dipartimento di Fisica</I>
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Wei Shiqiang
Electrotechnical Laboratory
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Oyanagi Hiroyuki
Electrotechnical Laboratory
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Kawanami Hitoshi
Electrotechnical Laboratory
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Sakamoto Kunihiro
Electrotechnical Laboratory
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Sakamoto Tsunenori
Electrotechnical Laboratory
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Tamura Kazuhisa
Physical Chemistry Laboratory, Division of Chemistry, Hokkaido University
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Saini Naurang
Universita di Roma ''''La Sapienza'', Dipartimento di Fisica
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Uosaki Kohei
Physical Chemistry Laboratory, Division of Chemistry, Hokkaido University
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Uosaki Kohei
<I>Physical Chemistry Laboratory, Division of Chemistry, Hokkaido University</I>
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Sakamoto Kunihiro
<I>Electrotechnical Laboratory</I>
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Tamura Kazuhisa
<I>Physical Chemistry Laboratory, Division of Chemistry, Hokkaido University</I>
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Kawanami Hitoshi
<I>Electrotechnical Laboratory</I>
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Wei Shiqiang
<I>Electrotechnical Laboratory</I>
関連論文
- Evidence for Critical Strain in Mismatched Epitaxial Growth: Atomic Migration Induced by Strain
- Local structures of isovalent and heterovalent dilute impurities in Si crystal probed by fluorescence x-ray absorption fine structure