Evidence for Critical Strain in Mismatched Epitaxial Growth: Atomic Migration Induced by Strain

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概要

• 論文の詳細を見る

著者

• Oyanagi Hiroyuki

  Electrotechnical Laboratory

• Oyanagi Hiroyuki

  <I>Electrotechnical Laboratory</I>

• Fons Paul

  <I>Electrotechnical Laboratory</I>

• Matsuhata Hirofumi

  Electrotechnical Laboratory

• Fons Paul

  Electrotechnical Laboratory

関連論文

• Evidence for Critical Strain in Mismatched Epitaxial Growth: Atomic Migration Induced by Strain
• Local structures of isovalent and heterovalent dilute impurities in Si crystal probed by fluorescence x-ray absorption fine structure

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