Discrete damage traces from filamentation of Gauss-Bessel pulses
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概要
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Filamentation of Bessel-Gauss pulses propagating in borosilicate glass is found to produce damage lines extending over hundreds of micrometers and consisting of discrete, equidistant damage spots. These discrete damage traces are explained by self-regeneration of Gauss-Bessel beams during propagation and are potentially applicable in laser microfabrication of transparent materials.
- Discrete damage traces from filamentation of Gauss-Bessel pulsesの論文
著者
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MISAWA Hiroaki
Research Institute for Electronic Science, Hokkaido University
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Misawa H
Research Institute For Electronic Science Hokkaido University
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Misawa H
Tohoku Univ. Sendai Jpn
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MIZEIKIS Vygantas
Research Institute for Electronic Science, Hokkaido University
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Juodkazis S
Research Institute For Electronic Science Hokkaido University
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Mizeikis Vygantas
Research Institute For Electronic Science Hokkaido University
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