Estimation of Delay Test Quality and Its Application to Test Generation

概要

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As a method to evaluate delay test quality of test patterns SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM the following two things are important: for each transition fault (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.
一般社団法人情報処理学会の論文
2008-08-27