S0306-1-1 SIM/EBSDによる遮熱コーティングの微視組織評価([S0306-1]損傷の結晶解析的評価)

概要

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Damages in thermal barrier coatings (TBCs) exposured under high temperature are accumulated, and ultimately the spallation of top coats (TC) in TBCs is occurred. Main factors of these damages are formation of thermally grown oxide (TGO) and resintering of TC. In the present study, damages and microstructures in TBC under various thermal exposure conditions were evaluated by using Raman microspectroscopy, Scanning Ion Microscope (SIM) and Electron Backscattered Diffraction (EBSD). In TGO layers, Raman spectrum of α-Alumina was obtained, its crystallinity was varied with thermal exposure time. Similarly, thickness of TGO layer was varied with thermal exposure time. The change of TGO thickness corresponded to that of crystallinity of TGO. On the other hand, oxide was observed in bond coat. Its amount increased with thermal exposure time to 100h, above which it keep constant. Besides, 3 dimensional microstructure of TC layer were reconstructed by FIB serial-sectioning and EBSD method, TC layers had crystal with high-aspect ratio.
2010-09-04