Contact Resistance Measurement by TLM with Island-Electrodes and Its Application to the Study of GaAs/Ag-Zn Contacts
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概要
著者
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EMA Yoshinori
Department of Electrical Engineering, Shizuoka University
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Ema Yoshinori
Department Of Electrical And Electronic Engineering Faculty Of Engineering Shizuoka University
関連論文
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- Observation of Capacitance Variation with Illumination in Al-Amorphous Se-Al Structure
- Formation and Properties of Polycrystalline p-Type High-Conductivity CdTe Films by Coevaporation of CdTe and Te
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- Capacitance Variation with Time in Au/Amorphous Se/Al Structure
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- Effect of Deposition Rate and Substrate Temperature on Properties of CdTe Film
- Contact Resistance Measurement by TLM with Island-Electrodes and Its Application to the Study of GaAs/Ag-Zn Contacts
- p-Si/n-CdS Heterojunction Solar Cells