Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model(Special Issue on Test and Verification of VLSI)

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概要

• 論文の詳細を見る

• This paper proposes an operation-region model for analyzing and testing analog and mixed-signal circuits, which is based on observation of change in MOSFET operation regions. First, the relation between the change in MOSFET operation regions and the fault behavior of a mixed-signal circuit containing a bridging fault is investigated. Next, we propose an analysis procedure based on the operation-region model and apply it to generate the optimal input combination for testing the circuit. We also determine which transistors should be observed in order to estimate the circuit behavior. Since the operation-region model is a method for modeling circuit behavior abstractly, the proposed method will be useful for modeling circuit behavior and for analyzing and testing many kinds of analog and mixed-signal circuits.

• 一般社団法人電子情報通信学会の論文
• 2002-10-01

著者

• Miura Yukiya

  Graduate Course Of Electrical Engineering Tokyo Metropolitan University

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• An Analysis of the Relationship between IDDQ Testability and D-Type Flip-Flop Structure
• Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model(Special Issue on Test and Verification of VLSI)

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