Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 2002-04-30

著者

• Schuler Franz

  Infineon Technologies Affiliated To Imec

• TEMPEL Georg

  Infineon Technologies, affiliated to IMEC

• MELZNER Hanno

  Infineon Technologies, Otto-Hahn-Ring

• JACOB Michael

  Infineon Technologies

• HENDRICKX Paul

  IMEC

• WELLEKENS Dirk

  IMEC

• HOUDT Jan

  IMEC

• Tempel Georg

  Infineon Technologies Affiliated To Imec

• Melzner Hanno

  Infineon Technologies Otto-hahn-ring

関連論文

• Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model
• Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure
• A CMOS DC Voltage Doubler with Nonoverlapping Switching Control
• Failure Rate Prediction and Accelerated Detection of Anomalous Charge Loss in Flash Memories by Using an Analytical Transient Physics-Based Charge Loss Model

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