Analysis of Crystallographic Orientation on Textured Ca-doped (ZnO)_mIn_2O_3 Ceramics by Electron Back Scattering Diffraction Pattern(Characterization,<Special Issue>Guest Editors Dedicated to Prof. Gunter Petzow: Modern Trends in Advanced Ceramics)

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Crystallographic orientation and phase identification on textured Ca-doped (ZnO)_mIn_2O_3 (m=3 and 4, denoted as Z_mIO) ceramics were investigated for better understanding and further improvement of the high-efficiency n-type thermoelectric oxide materials. Textured ceramics were prepared by the reactive-templated grain growth (RTGG) method, in which plate-like reactive seeds were exploited. A combination of electron backscatter diffraction pattern (EBSP) and energy dispersive X-ray spectrometry (EDS) techniques was utilized for analyzing the textured specimen parallel and perpendicular to the original sheet plane in detail. We revealed that in the specimen plate-like grains were aligned parallel to the sheet plane with the thickness direction parallel to the c-axis of each grain. Parallel aligned trigonal Z_3IO domains with a 60° misorientation angle were observed in a single grain. Coexisting trigonal Z_3IO and hexagonal Z_4IO phases were also observed in a single grain. These axis-sharing crystallites must be formed by the in situ topotactic conversion from a common hexagonal template crystal.
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2006-11-01