Dielectric Morphology of Twin Domains in LaAIO_3 Observed by a Scanning Microwave Microscope : Electrical Properties of Condonsed Matter

スポンサーリンク

概要

• 論文の詳細を見る

• We investigated the twin domains of LaAIO_3 (001) substrate using a scanning microwave microscope (SMM). Since the SMM can image the local dielectric constant of a sample quantitatively, we can observe the difference of the dielectric constant in the twin domains. Especially the (110) domains were observed more clearly than (100) domains, we attribute this to the difference of the strain in the ferroelastic LaAIO_3.

• 社団法人応用物理学会の論文
• 2001-11-15

著者

• CHAR Kookrin

  School of Physics & Center for Strongly Correlated Materials Research, Seoul Narional University

• Char Kookrin

  School Of Physics And Center For Strongly Correlated Materials Research Seoul National University

• HYUN Sangjin

  School of Physics and Center for Strongly Correlated Materials Research, Seoul National University

• KIM Ahram

  School of Physics and Center for Strongly Correlated Materials Research, Seoul National University

• KWON Joonhyung

  School of Physics and Center for Strongly Correlated Materials Research, Seoul National University

• Kwon Joonhyung

  School Of Physics And Center For Strongly Correlated Materials Research Seoul National University

• Hyun Sangjin

  School Of Physics And Center For Strongly Correlated Materials Research Seoul National University

• Kim Ahram

  School Of Physics And Center For Strongly Correlated Materials Research Seoul National University

関連論文

• Evolution of Electrical Properties of Magnetic Tunnel Junction through Successive Dielectric Breakdowns
• Dielectric Morphology of Twin Domains in LaAIO_3 Observed by a Scanning Microwave Microscope : Electrical Properties of Condonsed Matter
• Evolution of Electrical Properties of Magnetic Tunnel Junction through Successive Dielectric Breakdowns

スポンサーリンク