Correction of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1981-04-05
著者
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HIBINO Michio
Department of Electronics, School of Engineering, Nagoya University
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KUZUYA Mikio
Department of Electronic Engineering, College of Engineering, Chubu University
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Hibino Michio
Department Of Electronics Faculty Of Engineering Nagoya University
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Hibino Michio
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
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Kuzuya Mikio
Department Of Electronics Faculty Of Engineering Nagoya University:(present Address) Department Of E
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Kuzuya Mikio
Department Of Electronic Engineering College Of Engineering Chubu University
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MARUSE Susumu
Department of Electronics, Faculty of Engineering, Nagoya University
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Maruse Susumu
Department Of Electrical Engineering Faculty Of Engineering Nagoya University
関連論文
- Increase of Current Density of the Electron Probe by Correction of the Spherical Aberration with a Side-Entry Type Foil Lens
- Effect of Argon Atmosphere on Self-Absorption of a Spectral Line in Laser Microprobe Analysis
- Application of Laser-Induced Plasma Spectroscopy to the Rapid Screening of Plastics for Heavy Metals
- Quantitative Analysis of Trace Lead in Tin-base Lead-free Solder by Laser-Induced Plasma Spectroscopy in Air at Atmospheric Pressure
- Correction of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens
- Rotatable Magnetic Anisotropy in Electron=Microscope Specimens of Permalloy
- High Resolution and Spectroscopic Cathodoluminescent Images in Scanning Electron Microscope
- The Mean Brightness of the Electron Microscope Gun
- Relativistic Considerations on Electron Optical Brightness