Rotatable Magnetic Anisotropy in Electron=Microscope Specimens of Permalloy

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概要

• 論文の詳細を見る

• The rotatable anisotropy observed in electron microscope specimens of Permalloy is investigated by Lorentz microscopy and torque method. The rotatable anisotropy of this kind is attributed to the thinness of the substrate supporting the Permalloy film, and it disappears when the thick (≥ 1,100Å) SiO films are used as substrates. Permalloy films evaporated on such thick SiO films can be observed by a high voltage electron microscope and thus it is possible to infer the properties of the films evaporated on glass from those of the electron microscope films.

• 社団法人応用物理学会の論文
• 1969-03-05

著者

• HIBINO Michio

  Department of Electronics, School of Engineering, Nagoya University

• Hibino Michio

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

• MARUSE Susumu

  Department of Electronics, Faculty of Engineering, Nagoya University

• Maruse Susumu

  Department Of Electrical Engineering Faculty Of Engineering Nagoya University

関連論文

• Increase of Current Density of the Electron Probe by Correction of the Spherical Aberration with a Side-Entry Type Foil Lens
• Correction of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens
• Rotatable Magnetic Anisotropy in Electron=Microscope Specimens of Permalloy
• High Resolution and Spectroscopic Cathodoluminescent Images in Scanning Electron Microscope
• The Mean Brightness of the Electron Microscope Gun
• Relativistic Considerations on Electron Optical Brightness

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