Measurement of Stress Induced Birefringence of Bi_<12>GeO_<20> Single Crystals by a New Ellipsometry : A: Applications and Fundamentals

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著者

Nagao Chie
Materials And Electronic Devices Laboratory Mitsubishi Electric Co.
MIKAMI Noboru
Materials & Electronic Devices Laboratory, Mitsubishi Electric Corporation
Mikami Noboru
Materials And Electronic Devices Laboratory Mitsubishi Electric Co.
SAWADA Takao
Materials and Electronic Devices Laboratory, Mitsubishi Electric Co.
SATO Ken
Materials and Electronic Devices Laboratory, Mitsubishi Electric Co.
Sawada Takao
Materials And Electronic Devices Laboratory Mitsubishi Electric Co.
Sato Ken
Materials And Electronic Devices Laboratory Mitsubishi Electric Co.
Sato Ken
Materials & Electronic Devices Laboratory Mitsubishi Electric Corporation

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