Selective Oxide Coating of Silicon Gate (SELOCS) : A-4: DEVICE TECHNOLOGY (1)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1979-03-01
著者
-
Sunami Hideo
Central Research Laboratory Hitachi Ltd.
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Koyanagi Mitsumasa
Central Research Laboratory Hitachi Ltd.
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- Generation of Dislocations Induced by Chemical Vapor Deposited Si_3N_4 Films on Silicon
- Selective Oxide Coating of Silicon Gate (SELOCS) : A-4: DEVICE TECHNOLOGY (1)
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