Measurement of Physical Constants with An X-Ray Three-Crystal Spectrometer : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
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- An X-Ray Phase Plate Using Bragg-Case Diffraction
- Intensity Anomaly of Thermal and Compton Scattering of X-Rays Accompanying the Bragg Reflection
- Temperature Effect on the Profile of X-Ray Diffraction of the Bragg Case from a Germanium Single Crystal
- Elliptically Polarized X-Rays Produced by the σ and π Components of Linearly Polarized X-Rays in the Laue Case Dynamical Diffraction
- Intensity Anomaly of X-Ray Compton and Thermal Scatterings Accompamying the Bragg Reflections from Perfect Si and Ge Crystals
- Intensity Anomaly of Fluorescent X-Ray Emission Accompanying the Laue Case Reflection from a Perfect Crystal
- Measurement of Physical Constants with An X-Ray Three-Crystal Spectrometer : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION
- Intensity Changes of Fluorescence from a NaI (Tl) Crystal during the Dynamical Diffaction Process
- Radio Frequency Absorption in Barium Chlorate
- Rotation of the Electric Vector of the Polarized X-Rays by Diffraction in Crystals