Elliptically Polarized X-Rays Produced by the σ and π Components of Linearly Polarized X-Rays in the Laue Case Dynamical Diffraction
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概要
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Interference phenomena between the o and 7( components of linearly polarizedX-rays are studied in the Laue case dynamical diffraction. It is shown experimen-tally th:at the polarization characteristics of the diffracted X-rays from Si changeclearly with thicknesses of the specimen and elliptically polarized X-rays are pro-duced by phase differences between the o and x components. Theoretical calcula-tions also confirm the experimental results.
- 社団法人日本物理学会の論文
- 1982-06-15
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