Analyses of Thermally Stimulated Current Curves with No Peaks
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概要
- 論文の詳細を見る
A theory that enables one to accurately estimate three parameters, namely, an energetic depth of carrier trap site E_t, an escape frequency factor ν and a charge carrier density n_t, from thermally stimulated current (TSC) curves with no peaks is proposed. Generally, these three parameters could not be evaluated from any TSC datum without peak coordinates. Such TSC data are usually measured experimentally in order to separate signals from each other in various composite cases. Our proposed theory makes it possible to evaluate several sets of three parameters. The proposal is a method to compensate the charges lost in experiments. Three types of charge compensation processes are reported in detail. The accuracy of evaluation of each of the three parameters is very good and the E_t values of three significant figures could be obtained by numerical analyses.
- 社団法人応用物理学会の論文
- 2000-01-15
著者
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MAETA Shigeyoshi
Department of Electrical Engineering, Faculty of Engineering, Osaka Institute of Technology
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Maeta Shigeyoshi
Department Of Electrical Engineering Faculty Of Engineering Osaka Institute Of Technology
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KAMITANI Yoshimi
Department of Electrical Engineering, Faculty of Engineering, Osaka Institute of Technology
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Kamitani Yoshimi
Department Of Electrical Engineering Faculty Of Engineering Osaka Institute Of Technology
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- Analyses of Thermally Stimulated Current Curves with No Peaks
- A New Method for Determining the Trap Depth from Thermally Stimulated Current
- Proposal of Slope Estimation Method II Making Possible the Accurate Evaluation of Energy Depth of Carrier Traps from Partial Region of Thermally Stimulated Current Curves
- Proposal of the New Thermally Stimulated Current Curve Having a Straight Line Passing through the Origin
- On the Determination of Trap Depth from Thermally Stimulated Currents
- Trap States of Tris-8-(Hydroxyquinoline)Aluminum Degraded by Blue Laser Using Thermally Stimulated Current Method
- Computer Simulation of Thermally-Stimulated Currents in an Anthracene Single Crystal with Discrete Shallow Traps
- On the Determination of the Trap Depths from Thermally Stimulated Currents II