A New Method for Determining the Trap Depth from Thermally Stimulated Current
スポンサーリンク
概要
- 論文の詳細を見る
A new method for determining the energy depth of the trap E_t from a thermally stimulated current is proposed. This method uses a slope at an arbitrary point in the Arrhenius plot of the TSC on the lower side of the temperature of the TSC maximum. In the Arrhenius plot, the current range over ca. 20% of the TSC maximum is hardly influenced by the fluctuation of zero level, but this region is not used in an initial rise method. In the present method, the range up to ca. 95 % of the TSC maximum can be used, and the more accurate value E_t without the influence of background noise can be necessarily evaluated. This method is divided into five modes of graphical solution and a mode of numerical calculation. The procedures for obtaining E_t are simple, and it is possible to obtain the E_t value to three significant digits. The respective methods are applied to the TSC experimentally observed and numerically calculated results in an anthracene single crystal, and the results are shown.
- 社団法人応用物理学会の論文
- 1980-04-05
著者
-
Maeta Shigeyoshi
Department Of Electrical Engineering Faculty Of Engineering Osaka Institute Of Technology
-
Maeta Shigeyoshi
Department Of Electrical Engineering Osaka Institute Of Technology
-
SAKAGUCHI Kiyokazu
Department of Electrical Engineering, Osaka Institute of Technology
-
Sakaguchi Kiyokazu
Department Of Electrical Engineering Osaka Institute Of Technology
関連論文
- Measurement of Thermally Stimulated Currents Induced by Q-Switched Ruby Laser in Anthracene Single Crystals
- Analyses of Thermally Stimulated Current Curves with No Peaks
- A New Method for Determining the Trap Depth from Thermally Stimulated Current
- Proposal of Slope Estimation Method II Making Possible the Accurate Evaluation of Energy Depth of Carrier Traps from Partial Region of Thermally Stimulated Current Curves
- Proposal of the New Thermally Stimulated Current Curve Having a Straight Line Passing through the Origin
- On the Determination of Trap Depth from Thermally Stimulated Currents
- Trap States of Tris-8-(Hydroxyquinoline)Aluminum Degraded by Blue Laser Using Thermally Stimulated Current Method
- Computer Simulation of Thermally-Stimulated Currents in an Anthracene Single Crystal with Discrete Shallow Traps
- On the Determination of the Trap Depths from Thermally Stimulated Currents II