New Treatment for Tomographic Reconstruction of Refractive Index Profiles of Inhomogeneous Objects from Slope Measurements
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1998-06-30
著者
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Rios S
Univ. La Laguna Esp
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Acosta Eva
Area De Optica Departamento De Fisoca Alicada Facultad De Fisica Universidade De Santiago De Compost
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RIOS Susana
Area de Optica, Departamento de Fisica Aplicada,Facultade de Fisica, Universidade de Santiago de Com
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Rama Maria
Area de Optica, Departamento de Fisoca Alicada, Facultad de Fisica,Universidade de Santiago de Compo
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Rama Maria
Area De Optica Departamento De Fisica Aplicada Facultad De Fisica Universidade De Santiago De Compos
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Rama Maria
Area De Optica Departamento De Fisoca Alicada Facultad De Fisica Universidade De Santiago De Compost
関連論文
- Accurate Estimation of Aberrations of Microoptics Components through Intensity Measurements : Numerical Simulations for Best Positioning and Noise Analysis
- Estimation of Optical Phase Aberrations of Micro-Optics Components by the Irradiance Transport Equation
- New Treatment for Tomographic Reconstruction of Refractive Index Profiles of Inhomogeneous Objects from Slope Measurements
- Numerical Method to Fit the Refractive Index Profile of Planar Microlenses Made by Ion Exchange Techniques