Microscopic Mechanism of Electrical Noise in Co/Si Thin Film Structures
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-06-01
著者
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CHO Nam-Ihn
Department of Electronics, Information and Communication Engineering, Sunmoon University
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NAM Hyoung
Department of Electronics, Information and Communication Engineering, Sunmoon University
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Cho Nam-ihn
Department Of Electronics Engineering And Center For Science And Advanced Technology Sun Moon Univer
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Yu Soon
Department Of Electronics Engineering And Center For Science And Advanced Technology Sun Moon Univer
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Nam Hyoung
Department Of Electronic Engineering Sun Moon Univerity
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Nam Hyoung
Department Of Electronics Engineering And Center For Science And Advanced Technology Sun Moon Univer
関連論文
- Feasibility of Microelectronic Quartz Temperature and Pressure Sensors
- Microscopic Mechanism of Electrical Noise in Co/Si Thin Film Structures
- High Quality GaN Growth on (0001) Sapphire by Ion-Removed Electron Cyclotron Resonance Molecular Beam Epitaxy and First Observation of (2×2) and (4×4) Reflection High Energy Electron Diffraction Patterns
- Formation of Nanostructures by Oxidation of Si at Low Temperature