Photo-CVD Direct Patterning of Silicon Oxide Films by Optical Projection
スポンサーリンク
概要
- 論文の詳細を見る
patterned silicon oxide films from gaseous hexamethyldisilazane (HMDS) were deposited by a direct patterning method of photoinduced chemical vapor deposition (photo-CVD) using an argon-fluoride (ArF) excimer laser and a photomask. From Auger electron spectroscopy (AES) analysis, these films are seen to have much oxygen and carbon contamination. The growth mechanism was discussed by considering dissociation, adsorption and chemical reaction.
- 社団法人応用物理学会の論文
- 1990-08-20
著者
関連論文
- Fabrication and Evaluation of X-Ray Multilayer Mirrors Prepared by Laser-Induced Chemical Vapor Deposition
- Photo-CVD Direct Patterning of Silicon Oxide Films by Optical Projection
- Tungsten-Carbon X-ray Multilayered Mirror Prepared by Photo-Chemical Vapor Deposition